Atomic Force Microscopy instrument demonstration

Australian National Fabrication Facility Qld Node

<P><A HREF="https://anff-q.org.au/" TARGET="_blank" DATA-MSYS-CLICKTRACK="0" REL="nofollow noopener noreferrer">ANFF-Q</A> will be hosting a new <A HREF="https://www.parksystems.com/index.php/products/small-sample-afm/park-nx10/overview" TARGET="_blank" DATA-MSYS-CLICKTRACK="0" REL="nofollow noopener noreferrer">Park NX10 Atomic Force Microscope</A> (AFM) from Tuesday 12 March until Friday 22 March, allowing researchers to come and try the machine on their own samples. AFM has wide applications in Material Science, Life Science, Nanotech and Electronics. AFM can be used for imaging, force measurement and manipulation of samples. This is achieved through the application and measurement of atomic forces between the tip of the AFM probe and the sample surface.</P>
<P>Dr ZiBin Chen, <A HREF="http://www.scitek.com.au/" TARGET="_blank" DATA-MSYS-CLICKTRACK="0" REL="nofollow noopener noreferrer">Scitek </A>Application Scientist, will give a demonstration of the <A HREF="https://www.parksystems.com/index.php/products/small-sample-afm/park-nx10/overview" TARGET="_blank" DATA-MSYS-CLICKTRACK="0" REL="nofollow noopener noreferrer">Park NX10 AFM</A>. Current measurement modes available for the demonstration include:</P>
<UL>
<LI>Contact & True Non-contact modes.</LI>
<LI>In-liquid imaging.</LI>
<LI>3D topography with in-situ heating capability.</LI>
<LI>Piezoelectric Force Microscopy (PFM).</LI>
<LI>Dynamic Contact – EFM (DC-EFM) — this is an enhanced EFM technique (one-pass surface potential mapping) that is patented by Park Systems and very similar to PFM.</LI>
<LI>Scanning Kelvin Probe Microscopy (SKPM). </LI>
<LI>Magnetic Force Microscopy (MFM) — mapping of the magnetic force between the magnetised tip and the sample.</LI>
<LI>Force Modulation Microscopy (FMM), which is used to detect variations in the mechanical properties of the samples surface such as elasticity, adhesion and friction.</LI>
</UL>

Atomic Force Microscopy instrument demonstration

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Atomic Force Microscopy instrument demonstration

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