AFM fundamentals and imaging capacities

The atomic force microscope (AFM) has been extensively used in nanoscale research for its well-known topographic imaging capability. Other than the most basic functions, AFM can boost your research in many ways by also measuring electric, magnetic and piezoelectric properties of surfaces. This presentation will introduce AFM fundamentals along with some advanced characterisation derived from its commonly used topographic imaging modes, such as Kelvin Probe Force Microscopy, Magnetic Force Microscopy and Piezoelectric Force Microscopy.